{ "id": "2309.05945", "version": "v1", "published": "2023-09-12T03:50:05.000Z", "updated": "2023-09-12T03:50:05.000Z", "title": "Gap and magnetic engineering via doping and pressure in tuning the colossal magnetoresistance in (Mn$_{1-x}$Mg$_x$)$_3$Si$_2$Te$_6$", "authors": [ "Chaoxin Huang", "Mengwu Huo", "Xing Huang", "Hui Liu", "Lisi Li", "Ziyou Zhang", "Zhiqiang Chen", "Yifeng Han", "Lan Chen", "Feixiang Liang", "Hongliang Dong", "Bing Shen", "Hualei Sun", "Meng Wang" ], "comment": "5 pages, 5 figures", "categories": [ "cond-mat.mtrl-sci", "cond-mat.str-el" ], "abstract": "Ferrimagnetic nodal-line semiconductor Mn$_3$Si$_2$Te$_6$ keeps the records of colossal magnetoresistance (CMR) and angular magnetoresistance (AMR). Here we report tuning the electronic transport properties via doping and pressure in (Mn$_{1-x}$Mg$_x$)$_3$Si$_2$Te$_6$. As the substitution of nonmagnetic Mg$^{2+}$ for magnetic Mn$^{2+}$, ferrimagnetic transition temperature $T_C$ gradually decreases, while the resistivity increases significantly. At the same time, the CMR and AMR are both enhanced for the low-doping compositions (e.g., $x = 0.1$ and 0.2), which can be attributed to doping-induced broadening of the band gap and a larger variation range of the resistivity when undergoing a metal-insulator transition by applying a magnetic field along the $c$ axis. On the contrary, $T_C$ rises with increasing pressure due to the enhancement of the magnetic exchange interactions until a structural transition at $\\sim$13 GPa. Meanwhile, the activation gap is lowered under pressure and the magnetoresistance is decreased dramatically above 6 GPa where the gap is closed. The results reveal that doping and pressure are effective methods to tune the activation gap, and correspondingly, the CMR and AMR in nodal-line semiconductors, providing an approach to investigate the magnetoresistance materials for novel spintronic devices.", "revisions": [ { "version": "v1", "updated": "2023-09-12T03:50:05.000Z" } ], "analyses": { "keywords": [ "colossal magnetoresistance", "magnetic engineering", "ferrimagnetic nodal-line semiconductor mn", "activation gap", "electronic transport properties" ], "note": { "typesetting": "TeX", "pages": 5, "language": "en", "license": "arXiv", "status": "editable" } } }