{ "id": "1612.01975", "version": "v1", "published": "2016-12-06T20:09:03.000Z", "updated": "2016-12-06T20:09:03.000Z", "title": "Hyperuniformity of Quasicrystals", "authors": [ "Erdal C. Oğuz", "Joshua E. S. Socolar", "Paul J. Steinhardt", "Salvatore Torquato" ], "comment": "12 pages, 14 figures", "categories": [ "cond-mat.stat-mech" ], "abstract": "Hyperuniform systems, which include crystals, quasicrystals and special disordered systems, have attracted considerable recent attention, but rigorous analyses of the hyperuniformity of quasicrystals have been lacking. We employ a new criterion for hyperuniformity to quantitatively characterize quasicrystalline point sets generated by projection methods. Reciprocal space scaling exponents characterizing the hyperuniformity of one-dimensional quasicrystals are computed and shown to be consistent with independent calculations of the scaling exponent characterizing the variance $\\sigma^2(R)$ in the number of points contained in an interval of length $2R$. One-dimensional quasicrystals produced by projection from a two-dimensional lattice onto a line of slope $1/\\tau$ are shown to fall into distinct classes determined by the width of the projection window. For a countable dense set of widths, $\\sigma^2(R)$ is uniformly bounded for large $R$; for all others, $\\sigma^2(R)$ scales like $\\ln R$. This distinction provides a new classification of one-dimensional quasicrystalline systems and suggests that measures of hyperuniformity may define new classes of quasicrystals in higher dimensions as well.", "revisions": [ { "version": "v1", "updated": "2016-12-06T20:09:03.000Z" } ], "analyses": { "keywords": [ "hyperuniformity", "space scaling exponents characterizing", "one-dimensional quasicrystals", "quantitatively characterize quasicrystalline point sets", "one-dimensional quasicrystalline systems" ], "note": { "typesetting": "TeX", "pages": 12, "language": "en", "license": "arXiv", "status": "editable" } } }